UltraScan VIS Spectrophotometer

Overview

The UltraScan VIS color measurement benchtop spectrophotometer/colorimeter measures opaque, transparent, and translucent solids and liquids in the complete CIE recommended spectral range of 360 – 780 nm. It can be used in production and in the laboratory for inspecting raw materials, evaluating finished product or developing methods for color analysis.

Excellent precision on opaque, transparent, translucent, and even dark and highly saturated samples.
The UltraScan VIS easily measures both reflected and transmitted color as well as transmission haze and meets CIE, ASTM and USP guidelines for accurate color measurement. UltraScan VIS uses diffuse/8° geometry with automated specular component inclusion/exclusion. For transmission measurement, the use of a robust CIE-conforming sphere instrument (TTRAN Total Transmission mode) effectively negates the effects of minor scattering typically found in transparent samples.

Because of its exceptional inter-instrument agreement and long-term stability, you can be confident that differences between measurements are due to product color changes, not instrument variability. Materials on the borderline of accepted tolerances will not be unnecessarily rejected.

Explore all the additional features and benefits below.

FEATURES

Measures reflectance, transmittance and haze

Wavelength range 360 nm – 780 nm

10 nm optical resolution and reporting interval

Two reflectance measurement areas

Exceptional inter-instrument agreement

Automated UV calibration and control

Large transmission compartment open on three sides

Includes EasyMatch QC software

PRODUCT SPECIFICATIONS

Measurement Principle: Dual-beam benchtop spectrophotometer/colorimeter

Geometry: Diffuse d/8° reflectance, d/8° total transmission, d/0° regular transmission

Spectrophotometer/Colorimeter: Two 256 element diode arrays with a high resolution, concave holographic grating

Sphere Diameter: 152 mm (6 in.)

Sphere Coating: Spectraflectâ„¢ for sphere, Duraflectâ„¢ for port plate and specular exclusion door

Port Size/Measured Area:

  • Port Diameter/View Diameter in RSIN/RSEX reflectance modes
    • Large Area View (LAV): 25 mm (1 in) illuminated/19 mm (0.75 in) measured
    • Small Area View (SAV): 9.5 mm (0.375 in) illuminated/6 mm (0.25 in) measured
  • Port Diameter/View Diameter in TTRAN transmittance modes
    • Large Area View (LAV): 25 mm (1 in) illuminated/17.4 mm (0.69 in) measured
    • Small Area View (SAV): 25 mm (1 in) illuminated/10 mm (0.40 in) measured
  • Port Diameter/View Diameter in RTRAN transmittance mode where lens is field stop for all areas of view
    • Large Area View (LAV): 17 mm (0.67 in) illuminated/17 mm (0.67 in) measured
    • Small Area View (SAV): 17 mm (0.67 in) illuminated/17 mm (0.67 in) measured

Lens Switching for LAV/SAV: Automatic

Specular Component: Automated Included (RSIN) or Excluded (RSEX) in reflectance

Spectral Range: 360 nm – 780 nm full CIE visible range

Wavelength Resolution: < 2 nm

Effective Bandwidth: 10 nm equivalent triangular

Reporting Interval: 10 nm

Photometric Range: 0 to 150 %

Photometric Resolution: 0.003 % (0.01 % reported)

Light Source: Pulsed Xenon lamp, filtered to approximate D65 daylight

Automatic UV Control:

  • 400 nm cutoff filter for UV control and UV exclusion
  • Optional 420 nm cutoff filter for UV exclusion

Flashes per Measurement: 1 in LAV mode (4 in. SAV mode)

Measurement Time: < 5 seconds

Transmission Modes: Total (TTRAN) and Regular (RTRAN)

Transmission Compartment: Large and open on 3 sides, 10.2 cm D X 35.6 cm W x 16.5 cm H (4 in. D x 14 in. W x 6.5 in. H)

Standards Conformance

  • Reflectance: CIE 15:2004, ISO 7724/1, ASTM E1164, DIN 5033, Teil 7 and JIS Z 8722 Condition C
  • Transmittance: CIE 15:2004, ASTM E1164, DIN 5033 Teil 7 and JIS Z 8722 Condition E, G Haze conformance per ASTM D1003 Section 8. Procedure B Spectrophotometer

Standards Traceability: Instrument standard assignment in accordance with National Institute of Standards and Technology (NIST) following practices described in CIE Publication 44 and ASTM E259

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Contact us today to learn how our measurement solutions can transform your quality control processes. Let’s work together to achieve precision and excellence.

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